
Si5040
Rev. 1.3 11
Table 5. AC Characteristics—TXDOUT (Transmitter Output)
(V
DD
= 1.8 V +5/–10%, T
A
= –40 to 95 C)
Parameter Symbol Test Condition Min Typ Max Unit
Output Rise + Fall Times t
R
, t
F
Figure 2 20 25 30 ps
Output Return Loss 400 kHz–10 GHz
10 GHz–16 GHz
6
4
—
—
—
—
dB
dB
Random RMS Jitter Generation,
TXDOUT
1
J
GEN(rms)
OC-192, CMU mode
0
—2.84.6
mUI
RMS
Total Peak-to-Peak Jitter
Generation, TXDOUT
1
J
GEN(PP)
OC-192, CMU mode
0
—3660mUI
PP
Jitter Transfer Bandwidth
(Programmable)
CMU bandwidth [3:0]
(Register 134, bits 7:4)
J
BW
9.95 Gbps
0000 — 180 220 Hz
0001 — 1.37 1.76 kHz
0010 — Not supported kHz
0100 — 380 760 kHz
0101 — Not supported kHz
0110 — Not supported kHz
Jitter Transfer Peaking < 120 kHz — 0.03 dB
Acquisition Time
REFCLK
Referenceless
T
AQ
—
—
—
—
50
61
ms
ms
Input Reference Clock Frequency
2
RC
FREQ
ref clk /16 mode
ref clk /64 mode
618.75
154.687
622
155
709.4
177.35
MHz
Input Reference Clock Duty Cycle RC
DUTY
40 — 60 %
Input Reference Clock Frequency
Tolerance
RC
TOL
–100 — 100 ppm
Notes:
1. PRBS31 or SONET framed PRBS31 data. The integrated CMU filters out SONET framing effects.
2. Input reference clock frequency can be either Baud rate/16 or Baud rate/64 ±100 ppm. The typical and maximum
numbers specified here correspond to /16 or /64 of the typical and maximum data rate that the device supports.
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